The SQuIDS Lab is pleased to announce a seminar by Vincenzo Cuomo, Senior SW Testing and QA Engineer at STMicroelectronics, and Marco Palumbo on Testing and Quality Assurance for Smart Card Software Systems.
The seminar will take place on Friday, 22 May 2026, from 14:30 to 16:30, in Room PT-II-L, at the Piazzale Tecchio Campus.
The talk will offer insights into modern testing practices for smart card software, a domain where reliability, security, and compliance are essential. Drawing on his professional experience at STMicroelectronics, which is the biggest semiconductor manufacturer in Europe and among the key players on the global scene, Vincenzo Cuomo and Marco Palumbo will discuss key challenges, industrial practices, and quality assurance strategies used in the development and validation of smart card technologies.
The seminar is organized within the Software Project Management and Evolution course held by Proff. Sergio Di Martino and Luigi Libero Lucio Starace, and is open to students, researchers, and anyone interested in software testing, quality assurance, and embedded secure systems.